Evaluation of Space Enviroment
and Effects on Materials
(MIS) Archive System
NASA Langley Research CenterHampton, Virginia
Meteoroid Impact Sensor
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Space Environments &Technology Archive System Home Page |
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Space Environments &Effects Home Page |
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Responsible Parties:
Page Content: William H. Kinard Page Construction: Thomas H. See |
When a particle impacts the MOS sensor, the material from the crater is ionized creating a temporary short across the dielectric material and a closed circuit. A signal is then transmitted to a counter which denoted the time and sensor location. This data is used in determining particle flux and directionality.
AORP | Clementine | EuReCa | ESEM | Hubble
LDEF | MDIM | MEEP | MIS | MPID