LDEF Materials - Category: Detector

Category:  Detector, MOS
Experiment Number:  AO201 - Interplanetary Dust Experiment
Associated Tray(s):  Tray Location:  B12 - Orientation: 81.9 degrees off ram incidence angle
Item, Name or Use:  Detector
Item, Type:  Specimen
Material, Type of:  Ceramic, metal
Material Designation/Trade Name:  Silicon  wafer, boron doped, with SiO2 insulating layers 4000 angstroms and 10,000 angstroms thick, aluminum deposited coating 1 um thick
Material, Composition:  Si, SiO2, Al
Material, Remarks:  Exp
Reference:  No value in DB


Category:  Detector, MOS
Experiment Number:  AO201 - Interplanetary Dust Experiment
Associated Tray(s):  Tray Location:  C03 - Orientation: 171.9 degrees off ram incidence angle; trailing edge
Item, Name or Use:  Detector
Item, Type:  Specimen
Material, Type of:  Ceramic, metal
Material Designation/Trade Name:  Silicon  wafer, boron doped, with SiO2 insulating layers 4000 angstroms and 10,000 angstroms thick, aluminum deposited coating 1 um thick
Material, Composition:  Si, SiO2, Al
Material, Remarks:  Exp
Reference:  No value in DB


Category:  Detector, MOS
Experiment Number:  AO201 - Interplanetary Dust Experiment
Associated Tray(s):  Tray Location:  C09 - Orientation: 8.1 degrees off ram incidence angle; leading edge
Item, Name or Use:  Detector
Item, Type:  Specimen
Material, Type of:  Ceramic, metal
Material Designation/Trade Name:  Silicon  wafer, boron doped, with SiO2 insulating layers 4000 angstroms and 10,000 angstroms thick, aluminum deposited coating 1 um thick
Material, Composition:  Si, SiO2, Al
Material, Remarks:  Exp
Reference:  No value in DB


Category:  Detector, MOS
Experiment Number:  AO201 - Interplanetary Dust Experiment
Associated Tray(s):  Tray Location:  D06 - Orientation: 98.1 degrees off ram incidence angle
Item, Name or Use:  Detector
Item, Type:  Specimen
Material, Type of:  Ceramic, metal
Material Designation/Trade Name:  Silicon  wafer, boron doped, with SiO2 insulating layers 4000 angstroms and 10,000 angstroms thick, aluminum deposited coating 1 um thick
Material, Composition:  Si, SiO2, Al
Material, Remarks:  Exp
Reference:  No value in DB


Category:  Detector, MOS
Experiment Number:  AO201 - Interplanetary Dust Experiment
Associated Tray(s):  Tray Location:  G10 - Orientation: Earth-facing end
Item, Name or Use:  Detector
Item, Type:  Specimen
Material, Type of:  Ceramic, metal
Material Designation/Trade Name:  Silicon  wafer, boron doped, with SiO2 insulating layers 4000 angstroms and 10,000 angstroms thick, aluminum deposited coating 1 um thick
Material, Composition:  Si, SiO2, Al
Material, Remarks:  Exp
Reference:  No value in DB


Category:  Detector, MOS
Experiment Number:  AO201 - Interplanetary Dust Experiment
Associated Tray(s):  Tray Location:  H11 - Orientation: Space-facing end
Item, Name or Use:  Detector
Item, Type:  Specimen
Material, Type of:  Ceramic, metal
Material Designation/Trade Name:  Silicon  wafer, boron doped, with SiO2 insulating layers 4000 angstroms and 10,000 angstroms thick, aluminum deposited coating 1 um thick
Material, Composition:  Si, SiO2, Al
Material, Remarks:  Exp
Reference:  No value in DB

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