IDE database - Info on EDS analyses

Information on EDS analyses

Two different SEM/EDS systems were used in the analyses:

A Hitachi S-530 scanning electron microscope equipped with a Tracor-Northern TN5500 EDS, allowing detection of all elements with Z>10(Ne) with minimum detection sensitivity ranging from 0.1 > 1.0% atomic concentration.
A JEOL JSM-840A Scanning Electron Microscope with a EDS Link Pentafet Detector and DTSA Version 1.0.

Where available, an image showing the positions where the particular EDS spectra were obtained, are included with the index page of the EDS analyses of a particular feature.

Only the data files produced by the JEOL analyses used on the S1003 aluminum craters were processed in that way that the underlying energy spectra data can be accessed from within this database by clicking on the spectrum and saving the data file as a text file using the approriate menu of your viewer application. You may also download the data as HTML file by activating a function probably labeled "Load to Disk" in your viewer. File format is UNIX-type ASCII text file. An example spectrum is shown below.

Printouts of EDS Spectra from the Hitachi S-530 were scanned and included in the archive as bitmaps. No numerical data is avaiable for those spectra.

The data format is CSV, comma seperated values, which can be imported by most spreadsheets and plot software and is also the standard data format of BASIC text data files on most platforms. The datafile from the depth profile shown above looks like that:

"keV","Counts"
0.005000, 7390.000000
0.010000, 7778.000000
0.015000, 8075.000000
0.020000, 8264.000000
0.025000, 8041.000000
0.030000, 7505.000000
0.035000, 6343.000000
0.040000, 5332.000000
.....

The "old" EDS spectra are simply scanned GIF's.