Hubble Presentations
Solar Array Drive Electronics Failure Investigation
Cindy Winslow / Lockheed Missiles and Space Corporation


SADE Description

Overview of Transistor Overstress Problem

Results of SADE-1 Inspection

  • Two transistors, T5 and T17 severely thermally stressed, conformal coating discolored and charred.
  • Two diodes, D8 and D10, severely thermally stressed, conformal coating discolored and charred.
  • Solder on connections became molten and reflowed between the two diodes.
  • Failed transistors gave no indication of defective construction.
  • All 27 boards inspected.
  • The heat sink will dissipate the heat and protect the transistors.

    PCB 916-220 110.0A, Resolver Decoder A

    PCB 916-220 510.0C, Multispeed Decoder

    PCB 916-220 350.00.0C Compensation Network Filter



    PCB 916 220.400.00.0/1C, Sine Converter Oscillator Divider



    Motherboard 916-220 400.00.0C, PCB Retainer Guides

    Additional Reading




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